
Compact scanning family
SC30
Compact high-precision scanning probe family for touch-trigger and continuous scanning measurement.- SC30-1, SC30-2, and SC30-3
- 21–400 mm stylus ranges
- Automatic magnetic coupling
Scanning probe family
Two contact-scanning platforms for different stylus and access requirements—from compact, everyday CMM scanning to long and heavy stylus configurations.
Probe, stylus, head, controller, software, and application details are reviewed together.


Select by application
Start with stylus reach, stylus mass, feature access, measurement function, and the CMM control workflow.

Compact scanning family

Long & heavy stylus scanning

SC30 compact scanning probe
The SC30 family is designed for both touch-trigger and continuous scanning measurement. A high-sensitivity Hall sensor supports responsive measurement performance, while automatic magnetic coupling supports use with the CZ10M-S and other compatible automatic probe heads.
Touch-trigger measurement and continuous scanning.
High-sensitivity displacement sensing for responsive measurement.
Mounts to CZ10M-S and other compatible automatic probe heads.
Leaf-spring configurations aligned to specified stylus ranges.
SC30 model range
Short stylus configuration
21–100 mmMeasuring range: ±0.5 mm · Resolution: 0.1 µmMedium stylus configuration
100–220 mmMeasuring range: ±0.5 mm · Resolution: 0.1 µmLong stylus configuration
220–400 mmMeasuring range: ±0.5 mm · Resolution: 0.1 µm| Probe parameter | SC30-1 | SC30-2 | SC30-3 |
|---|---|---|---|
| Weight | 180 g | 180 g | 180 g |
| Probe diameter | 33 mm | 33 mm | 33 mm |
| Stylus thread | M3 | M3 | M3 |
| Measuring range | ±0.5 mm | ±0.5 mm | ±0.5 mm |
| Stiffness | 0.6–1.5 N/mm | 0.6–1.5 N/mm | 0.6–1.5 N/mm |
| Resolution | 0.1 µm | 0.1 µm | 0.1 µm |
| Stylus length | 21–100 mm | 100–220 mm | 220–400 mm |
SC80 scanning probe
The SC80 is a continuous analog-output scanning probe designed for long and heavy stylus configurations, including internal part features. Its integrated automatic weight-balancing system supports stylus assemblies weighing up to 1,000 g.
Supports continuous scanning and displacement compensation.
Supports stylus assemblies up to 1,000 g.
All probe axes remain compliant during measurement.
Single-point probing, self-centering, and continuous scanning.

| Parameter | Specification |
|---|---|
| Product type | Continuous analog-output scanning probe |
| Measurement functions | Single-point probing, self-centering measurement, and continuous scanning |
| Probing force | 0.1–0.2 N |
| Scanning force | 0.3 N |
| Measuring range | ±1.0 mm |
| Allowable XYZ overstroke | ±3.0 mm |
| Maximum allowable stylus length | 600 mm |
| Maximum allowable stylus weight | 1,000 g |
| Resolution | 0.01 µm |
| Stylus clamping | Automatic |
Model comparison
SC30 and SC80 are distinct product platforms. The right choice depends on stylus configuration, access, measurement function, and system integration.
| Selection factor | SC30 family | SC80 |
|---|---|---|
| Primary positioning | Compact high-precision scanning family | Long and heavy stylus analog scanning |
| Measurement functions | Touch-trigger measurement and continuous scanning | Single-point probing, self-centering measurement, and continuous scanning |
| Stylus reach | Up to 400 mm | Up to 600 mm |
| Measuring range | ±0.5 mm | ±1.0 mm |
| Resolution | 0.1 µm | 0.01 µm |
| Automation feature | Automatic magnetic coupling for CZ10M-S and compatible heads | Automatic stylus clamping and automatic weight balancing |
| Best-fit applications | Compact scanning, modular stylus-length selection, routine CMM scanning workflows | Long/heavy stylus access, internal features, and deeper-access applications |
Final compatibility and performance must be confirmed for the complete CMM configuration, including probe head, controller, software, stylus assembly, rack strategy, and acceptance requirements.
Configuration review
A scanning probe is selected as part of a complete measurement system—not as an isolated component.
Required length, extension stack, ball diameter, access direction, and total assembly weight.
Internal bores, deep pockets, free-form surfaces, self-centering requirements, and collision clearance.
Probe-head interface, controller workflow, scanning capability, software capability, and rack compatibility.
Stylus qualification, rack strategy, reference sphere, test method, and project-specific acceptance criteria.
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