CF20 Series

Modular Five-Way Touch-Trigger Probe System

CF20 is a modular touch-trigger probing system designed for CMM inspection. The CF20-S body accepts four interchangeable five-way modules—LF, MF, SF and EF—so the measuring force can be matched to delicate components, routine inspection or heavier stylus configurations without changing the complete probe. Designed as a direct replacement for the Renishaw TP20 probe body, CF20-S integrates with the TP20 system and supports Renishaw PH10 and PH20 series probe heads.

Modular Design

One body + four force modules

No Recalibration

Swap modules without recalibration

High Accuracy

Excellent repeatability and stability

Auto or Manual

Supports automatic and manual CMMs

CF20-S TP20-compatible body module
CF20-SBody Module
CF20-LF Low Force Module
CF20-LFLow Force
CF20-MF Medium Force Module
CF20-MFMedium Force
CF20-SF Standard Force Module
CF20-SFStandard Force
CF20-EF Extended Force Module
CF20-EFExtended Force

CF20-S Body Module

CF20-S can replace the Renishaw TP20 probe body. It integrates with Renishaw PH10 and PH20 series probe heads while retaining manual or automatic module exchange without recalibration. Pair it with the LF, MF, SF or EF module to match the measuring force to each inspection.

Body diameter
16 mm
Body length
13.5 mm
Mounting interface
M8 thread
Probe-head support
PeakMerit CZ10 series; Renishaw PH10 and PH20 series
Direct replacement for
Renishaw TP20 probe body
Module exchange
Manual or automatic
Recalibration after module exchange
Not required
Compatible five-way modules
CF20-LF, CF20-MF, CF20-SF, CF20-EF
CF20-LF Low Force Module

CF20-LF

Low Force Module

Designed for delicate, low-force inspection applications such as rubber seals and other compliant components.

X/Y trigger
0.055 N
Z trigger
0.65 N
Stylus range
10–30 mm

CF20 can replace Renishaw TP20.

Low-force solution for delicate or easily deformable parts.
CF20-MF Medium Force Module

CF20-MF

Medium Force Module

A medium-force module for applications requiring greater probing resistance than low-force inspection.

X/Y trigger
0.10 N
Z trigger
1.90 N
Stylus range
10–60 mm

CF20 can replace Renishaw TP20.

Balanced measuring force for routine automatic or manual CMM inspection.
CF20-SF Standard Force Module

CF20-SF

Standard Force Module

The general-purpose module for most routine CMM inspection applications and common stylus configurations.

X/Y trigger
0.08 N
Z trigger
0.65 N
Stylus range
10–50 mm

CF20 can replace Renishaw TP20.

General-purpose five-way module for most routine CMM applications.
CF20-EF Extended Force Module

CF20-EF

Extended Force Module

Designed for large-diameter or heavier stylus assemblies and environments where vibration may cause false triggering.

X/Y trigger
0.10 N
Z trigger
3.20 N
Stylus range
10–60 mm

CF20 can replace Renishaw TP20.

Higher-force module for heavier styli and vibration-prone environments.

CF20 Five-Way Module Specifications

SpecificationCF20-LF Low ForceCF20-MF Medium ForceCF20-SF Standard ForceCF20-EF Extended Force
CMM operationAutomatic or manualAutomatic or manualAutomatic or manualAutomatic or manual
Trigger directions+/−X, +/−Y, +Z+/−X, +/−Y, +Z+/−X, +/−Y, +Z+/−X, +/−Y, +Z
Pre-travel variation±0.72 µm±1.20 µm±0.96 µm±2.40 µm
Unidirectional repeatability±0.42 µm±0.60 µm±0.42 µm±0.78 µm
Automatic exchange repeatability±0.60 µm±0.60 µm±0.60 µm±0.60 µm
Manual exchange repeatability±1.20 µm±1.20 µm±1.20 µm±1.20 µm
X/Y trigger force0.055 N0.10 N0.08 N0.10 N
Z trigger force0.65 N1.90 N0.65 N3.20 N
Force-test stylus length10 mm25 mm10 mm50 mm
Compatible stylus length10–30 mm10–60 mm10–50 mm10–60 mm
Stylus interfaceM2M2M2M2
Module dimensionsØ13.2 × 20.9 mmØ13.2 × 20.9 mmØ13.2 × 20.9 mmØ13.2 × 20.9 mm
Weight9.5 ± 0.5 g9.5 ± 0.5 g9.5 ± 0.5 g9.5 ± 0.5 g

Five-Way Triggering

+/−X, +/−Y, +Z for complete feature access

Quick Module Change

Manual or automatic change without recalibration

High Repeatability

As low as ±0.42 µm (unidirectional) for precise results

Wide Application Range

From delicate parts to heavy-duty measurement environments